Gulden, Mehmet Ali; Zencir, Ertan; Cavus, EnverZencir, Ertan2024-06-252024-06-2520220167-9260https://acikarsiv.thk.edu.tr/handle/123456789/1237This study describes a new method to compensate bias heating effects for microbolometer readout circuits using a finely adjustable CMOS resistance as a reference. The proposed self calibrated cooler-less structure dynamically modifies CMOS resistance during integration time. This compensation structure also includes a feedback loop, which forces the oscillators to work in the linear region. The proposed self calibration circuit is designed and simulated using a 65-nm process node, and achieves 40 mK NETD (Noise Equivalent Temperature Difference) value for one percent resistance non-uniformity of pixel resistance values across one row. The layout area of this circuit occupies approximately one third of the layout area used by classical readout circuits. The circuit dissipates one third of power compared with classical microbolometer readout approaches.EnglishReadout electronics; Microbolometer; Self-heating correction; Self-heating Self-calibration; VCO-based ADCArticle